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Research facilities

Laboratory for electron beam microanalysis

Building T – Room T 033

Tel.: +49 30 - 838 - 70869


Contact person: Dr. Moritz Liesegang, Mail: m.liesegang@fu-berlin.de

The Institute of Geological Sciences hosts a JEOL JXA 8200 Superprobe, equipped with five wavelength-dispersive spectrometers (WDS) and one energy-dispersive (EDS) detector. We perform non-destructive chemical analysis and imaging of solid materials at the micrometer scale using a focused electron beam.


The instrument is primarily used in WDS mode for quantitative analysis against reference materials and element distribution mapping.

Other applications are:

  • Qualitative element analysis (EDS, WDS)

  • Surface morphology (Secondary electron detector)

  • Element contrast imaging (Backscatter electron detector)


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Furnace laboratory

Building T – Room T 026

Tel.: +49 30 - 838 - 70811


Contact person: Prof. Dr. Timm John, Tel. +49 30 - 838 - 70103


The Laboratory hosts 4 laboratory chamber furnaces of type K114 up to 1100°C from Heraeus - Thermo Science.

Additionally there are 2 high temperature - furnaces type HTRV 70-250 up to 1600°C from Gero. And it also contains 2 high temperature - furnaces type HT 04/17 up to 1750°C from Nabertherm.

K114 chamber furnaces

Laboratory for mass spektometry

Building B – Room B 009

Tel.: +49 30 - 838 - 70608


Contact person: Dr. Uwe Wiechert, Tel. +49 30 - 838 - 7035

The device "MAT-253" is equipped with:

  • Gasbench II
  • Elemental analyzer
  • HT pyrolysis furnace


Field of application: measurement of isotope ratios:

  • Carbonates 18O/16O and 13C/12C
  • Water D/H, 18O/16O, 13C/12C (DIC)
  • Barium sulfate (BaSO4) 34S/32S, 18O/16O
  • Silver(I) sulfide (Ag2S) 34S/32S
  • Silver nitrate (AgNO3) 15N/14N, 18O/16O

Raman spectrometer laboratory

Building T – Room T 032

Tel.: +49 30 - 838 - 70824


Contact person: Dr. Anselm Loges, Tel. +49 30 - 838 - 71761, Mail: anselm.loges@fu-berlin.de


The Raman laboratory is equipped with a “Horiba ISA Dilor Labram” micro-confocal Raman spectrometer with a focal length of 300mm and a spectral resolution of up to 3.5 cm-1.

Depending on the analysed material and the applied method, the user can choose between the internal 632 nm He-Ne and an external 532 nm Nd-YAG laser. Maps and linescans can be done with the automated x-y table.



  • Phase identification of fluids, minerals and partly glasses (Fingerprinting)

  • Structural (e.g.: stress-strain, metamictisation) and orientation effects

  • Carbon thermometry

“Automated Mineralogy Lab”

Building T – Room T 030

Tel: +49 30 - 838 - 70823

Contact: Dr. J. C. Vrijmoed

Email: j.c.vrijmoed@fu-berlin.de


The Zeiss Sigma 300 VP Field-Emission Scanning Electron Microscope is equipped with:

  • Zeiss Gemini column
  • 2 Bruker Quantax Xflash 60mm2 SSD EDS Detectors for quantitative Element Analysis
  • 1 Variable Pressure Secondary Electron detector (VPSE)

  • 1 High Definition Back Scatter Detector (HDBSE)

  • 1 Inlens Detector

  • 2 Zeiss ATLAS Correlative microscopy system (1 online/1 offline Workstation)

  • 2 Mineralogic Mining automated Mineralogy systems (1 online/1 offline Workstation)

  • 2 Reservoir Mining automated Pore analysis systems (1 online/1 offline Workstation)


  • High-resolution automated surface imaging (Zeiss ATLAS)

  • Surface morphology imaging of uncoated, unpolished samples (Low Vac, Environmental SEM)

  • Automated quantitative Mineralogy- and Porosity mapping of thinsections

  • Fast automated search of specific Mineral Phases (i.e. Sulfides, Zircons)

  • Grain size/shape analysis and Mineral paragenesis analysis

  • Cathodoluminescence analysis (with VPSE Detector)

The ZEISS Axio Imager M2m is optimized for automated transmitted/reflected light thinsection mapping. It is equipped with:

  • 4 Objectives 2.5x, 5x, 10x, and 20x (optimized for reflected light)

  • Polarized transmitted light / motorized reflectors for polarized reflected light

  • Motorized stage

  • High Definition digital camera

  • Zen Blue Software

  • High performance PC for the analysis of GB-sized image data



  • Fast full thinsection mapping for the correlation with SEM images and EDS data

  • Fast thin section search for opaque phases like Sulfides, Oxides, etc.






X-ray diffraction laboratory

Building T – Room T 031

Tel.: +49 30 838 70 819


Contact Persons:

Dr. Moritz Liesegang; Mail: m.liesegang@fu-berlin.de

Prof. Dr. Christiane Stephan-Scherb; Tel. +49 30 - 838 - 60497


  • Panalytical Empyrean diffractometer with two different tube types: Cu or Co

  • Fixed divergence slit optics with different apertures from 1/16° - 2

  • PIXcel 1 D detector. This is a semiconductor detector, which detects on 255x255 pixels, so very fast measurements are possible. The detector can be used in energy discriminating mode, optimizing the sensitivity for Cu-Ka radiation and efficiently suppressing any fluorescence radiation that may occur in samples containing Fe.

  • Sample changer with a 15-position magazine.



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