Laboratory for electron beam microanalysis
Building T – Room T 033
Tel.: +49 30 - 838 - 70869
The Institute of Geological Sciences hosts a JEOL JXA 8200 Superprobe, equipped with five wavelength-dispersive spectrometers (WDS) and one energy-dispersive (EDS) detector. We perform non-destructive chemical analysis and imaging of solid materials at the micrometer scale using a focused electron beam.
The instrument is primarily used in WDS mode for quantitative analysis against reference materials and element distribution mapping.
Other applications are:
Qualitative element analysis (EDS, WDS)
Surface morphology (Secondary electron detector)
Element contrast imaging (Backscatter electron detector)
Building T – Room T 026
Tel.: +49 30 - 838 - 70811
Contact person: Prof. Dr. Timm John, Tel. +49 30 - 838 - 70103
The Laboratory hosts 4 laboratory chamber furnaces of type K114 up to 1100°C from Heraeus - Thermo Science.
Additionally there are 2 high temperature - furnaces type HTRV 70-250 up to 1600°C from Gero. And it also contains 2 high temperature - furnaces type HT 04/17 up to 1750°C from Nabertherm.
K114 chamber furnaces
Laboratory for mass spektometry
Building B – Room B 009
Tel.: +49 30 - 838 - 70608
Contact person: Dr. Uwe Wiechert, Tel. +49 30 - 838 - 7035
The device "MAT-253" is equipped with:
- Gasbench II
- Elemental analyzer
- HT pyrolysis furnace
Field of application: measurement of isotope ratios:
- Carbonates 18O/16O and 13C/12C
- Water D/H, 18O/16O, 13C/12C (DIC)
- Barium sulfate (BaSO4) 34S/32S, 18O/16O
- Silver(I) sulfide (Ag2S) 34S/32S
- Silver nitrate (AgNO3) 15N/14N, 18O/16O
Raman spectrometer laboratory
Building T – Room T 032
Tel.: +49 30 - 838 - 70824
The Raman laboratory is equipped with a “Horiba ISA Dilor Labram” micro-confocal Raman spectrometer with a focal length of 300mm and a spectral resolution of up to 3.5 cm-1.
Depending on the analysed material and the applied method, the user can choose between the internal 632 nm He-Ne and an external 532 nm Nd-YAG laser. Maps and linescans can be done with the automated x-y table.
Phase identification of fluids, minerals and partly glasses (Fingerprinting)
Structural (e.g.: stress-strain, metamictisation) and orientation effects
“Automated Mineralogy Lab”
Building T – Room T 030
Tel: +49 30 - 838 - 70823
Contact: Dr. J. C. Vrijmoed
The Zeiss Sigma 300 VP Field-Emission Scanning Electron Microscope is equipped with:
- Zeiss Gemini column
- 2 Bruker Quantax Xflash 60mm2 SSD EDS Detectors for quantitative Element Analysis
1 Variable Pressure Secondary Electron detector (VPSE)
1 High Definition Back Scatter Detector (HDBSE)
1 Inlens Detector
2 Zeiss ATLAS Correlative microscopy system (1 online/1 offline Workstation)
2 Mineralogic Mining automated Mineralogy systems (1 online/1 offline Workstation)
2 Reservoir Mining automated Pore analysis systems (1 online/1 offline Workstation)
High-resolution automated surface imaging (Zeiss ATLAS)
Surface morphology imaging of uncoated, unpolished samples (Low Vac, Environmental SEM)
Automated quantitative Mineralogy- and Porosity mapping of thinsections
Fast automated search of specific Mineral Phases (i.e. Sulfides, Zircons)
Grain size/shape analysis and Mineral paragenesis analysis
Cathodoluminescence analysis (with VPSE Detector)
The ZEISS Axio Imager M2m is optimized for automated transmitted/reflected light thinsection mapping. It is equipped with:
4 Objectives 2.5x, 5x, 10x, and 20x (optimized for reflected light)
Polarized transmitted light / motorized reflectors for polarized reflected light
High Definition digital camera
Zen Blue Software
High performance PC for the analysis of GB-sized image data
Fast full thinsection mapping for the correlation with SEM images and EDS data
Fast thin section search for opaque phases like Sulfides, Oxides, etc.
X-ray diffraction laboratory
Building T – Room T 031
Tel.: +49 30 838 70 819
Prof. Dr. Christiane Stephan-Scherb; Tel. +49 30 - 838 - 60497
Panalytical Empyrean diffractometer with two different tube types: Cu or Co
Fixed divergence slit optics with different apertures from 1/16° - 2
PIXcel 1 D detector. This is a semiconductor detector, which detects on 255x255 pixels, so very fast measurements are possible. The detector can be used in energy discriminating mode, optimizing the sensitivity for Cu-Ka radiation and efficiently suppressing any fluorescence radiation that may occur in samples containing Fe.
Sample changer with a 15-position magazine.