Laboratory for electron beam microanalysis
Building T – Room T 033
Tel.: +49 30 838 70869
Contact person: Dr. Xin Zhong
User regulations: download pdf
The Institute of Geological Sciences hosts a JEOL JXA 8200 Superprobe, equipped with five wavelength-dispersive spectrometers (WDS) and one energy-dispersive (EDS) detector. We perform non-destructive chemical analysis and imaging of solid materials at the micrometer scale using a focused electron beam.
The instrument is primarily used in WDS mode for quantitative analysis against reference materials and element distribution mapping.
Other applications are:
Qualitative element analysis (EDS, WDS)
Surface morphology (Secondary electron detector)
Element contrast imaging (Backscatter electron detector)