Assessing strain distributions in CuInSe2 thin films by electron backscatter diffraction, X-ray diffraction and Raman microscopy

Schäfer, N., Winkelmann, A., Wilkinson, A. J., Schmid, T., Schülli, T. U., Chahine, G. A., Marquardt, J., Schorr, S., Klaus, M., Genzel, C., Rissom, T., Abou-Ras, D. – 2016

Titel
Assessing strain distributions in CuInSe2 thin films by electron backscatter diffraction, X-ray diffraction and Raman microscopy
Verfasser
Schäfer, N., Winkelmann, A., Wilkinson, A. J., Schmid, T., Schülli, T. U., Chahine, G. A., Marquardt, J., Schorr, S., Klaus, M., Genzel, C., Rissom, T., Abou-Ras, D.
Verlag
Ultramicroscopy 169 (2016) 89 - 97
Datum
2016
Art
Text