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Characterization of Cu2SnSe3 by spectroscopic ellipsometry

Gurieva, G., Levcenco, S., Schorr, S., Leon, M., Serna, R., Nateprov, A., Arushanov, E.

Titel
Characterization of Cu2SnSe3 by spectroscopic ellipsometry
Verfasser
Gurieva, G., Levcenco, S., Schorr, S., Leon, M., Serna, R., Nateprov, A., Arushanov, E.
Verlag
Thin Solid Films Vol. 535. 384-386
Kennung
DOI:10.1016/j.tsf.2012.11.104
Art
Text