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Quantitative anomalous powder diffraction analysis of kesterite semiconductors

Többens, D., Gunder, R., Gurieva, G., Marquardt, J., Neldner, K., Valle-Rios, L. E., Zander, S., Schorr, S. – 2016

Titel
Quantitative anomalous powder diffraction analysis of kesterite semiconductors
Verfasser
Többens, D., Gunder, R., Gurieva, G., Marquardt, J., Neldner, K., Valle-Rios, L. E., Zander, S., Schorr, S.
Verlag
Powder Diffraction
Datum
2016
Quelle/n