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Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy

N. Schäfer, A. Winkelmann, A.J. Wilkinson, T. Schmid, T.U. Schülli, G.A. Chahine, J. Marquardt, S. Schorr, M. Klaus, C. Genzel, T. Rissom, D. Abou-Ras – 2016

Titel
Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy
Verfasser
N. Schäfer, A. Winkelmann, A.J. Wilkinson, T. Schmid, T.U. Schülli, G.A. Chahine, J. Marquardt, S. Schorr, M. Klaus, C. Genzel, T. Rissom, D. Abou-Ras
Verlag
Ultramicroscopy
Datum
2016