Springe direkt zu Inhalt

Quantitative anomalous powder diffraction analysis of kesterite semiconductors

Többens, D., Gunder, R., Gurieva, G., Marquardt, J., Neldner, K., Valle-Rios, L. E., Zander, S., Schorr, S. – 2016

Title
Quantitative anomalous powder diffraction analysis of kesterite semiconductors
Author
Többens, D., Gunder, R., Gurieva, G., Marquardt, J., Neldner, K., Valle-Rios, L. E., Zander, S., Schorr, S.
Publisher
Powder Diffraction 31 (3) (2016) 168-175
Date
2016
Type
Text