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Advanced EDS and µXRF Analysis of Earth and Planetary Materials using Spectrum Imaging, Computer-Controlled SEM and an Annular SDD

Salge, T., Tagle, R., Hecht, L., Ferriere, L., Ball, A.D., Kearsley, A.T., Smith, C., Jones, C. – 2014

Title
Advanced EDS and µXRF Analysis of Earth and Planetary Materials using Spectrum Imaging, Computer-Controlled SEM and an Annular SDD
Author
Salge, T., Tagle, R., Hecht, L., Ferriere, L., Ball, A.D., Kearsley, A.T., Smith, C., Jones, C.
Publisher
Microscopy and Microanalysis, 20 (Suppl. 3) , 1716-1717
Date
2014
Identifier
doi:10.1017/S1431927614010319
Type
Text