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Scanning Electron Microscopy Lab

“Automated Mineralogy Lab”

Building T – Room T 030

Tel: +49 30 - 838 - 70823

Contact: Dr. J. C. Vrijmoed

Email: j.c.vrijmoed@fu-berlin.de

 

The Zeiss Sigma 300 VP Field-Emission Scanning Electron Microscope is equipped with:

  • Zeiss Gemini column
  • 2 Bruker Quantax Xflash 60mm2 SSD EDSDetectors for quantitative Element Analysis
  • 1 Variable Pressure Secondary Electron detector (VPSE)

  • 1 High Definition Back Scatter Detector (HDBSE)

  • 1 Inlens Detector

  • 2 Zeiss ATLAS Correlative microscopy system (1 online/1 offline Workstation)

  • 2 Mineralogic Mining automated Mineralogy systems (1 online/1 offline Workstation)

  • 2 Reservoir Mining automated Pore analysis systems (1 online/1 offline Workstation)

Applications

  • High-resolution automated surface imaging (Zeiss ATLAS)

  • Surface morphology imaging of uncoated, unpolished Samples (Low Vac, Environmental SEM)

  • Automated quantitative Mineralogy- and Porosity mapping of thinsections

  • Fast automated search of specific Mineral Phases (i.e. Sulfides, Zirkons)

  • Grain size/shape analysis and Mineral paragenesis analysis

  • Cathodoluminescence analysis (with VPSE Detector)

The ZEISS Axio Imager M2m is optimized for automated transmitted/reflected light thinsection mapping. It is equipped with:

  • 4 Objectives 2.5x, 5x, 10x, and 20x (optimized for reflected light)

  • Polarized transmitted light / motorized reflectors for polarized reflected light

  • Motorized stage

  • High Definition digital camera

  • Zen Blue Software

  • High performance PC for the analysis of GB-sized image data

 

Applications

  • Fast full thin sections mapping for the correlation with SEM images and EDS data

  • Fast thin section search for opaque phases like Sulfides, Oxides, etc.