Assessing strain distributions in CuInSe2 thin films by electron backscatter diffraction, X-ray diffraction and Raman microscopy

N. Schäfer, A. Winkelmann, A.J. Wilkinson, T. Schmid, T.U. Schülli, G.A. Chahine, J. Marquardt, S. Schorr, M. Klaus, C. Genzel, T. Rissom, D. Abou-Ras— 2016

TitelAssessing strain distributions in CuInSe2 thin films by electron backscatter diffraction, X-ray diffraction and Raman microscopy
VerfasserN. Schäfer, A. Winkelmann, A.J. Wilkinson, T. Schmid, T.U. Schülli, G.A. Chahine, J. Marquardt, S. Schorr, M. Klaus, C. Genzel, T. Rissom, D. Abou-Ras
VerlagUltramicroscopy 169 (2016) 89 - 97
Datum2016
ArtText