Advanced EDS and µXRF Analysis of Earth and Planetary Materials using Spectrum Imaging, Computer-Controlled SEM and an Annular SDD

Salge, T., Tagle, R., Hecht, L., Ferriere, L., Ball, A.D., Kearsley, A.T., Smith, C., Jones, C.— 2014

TitelAdvanced EDS and µXRF Analysis of Earth and Planetary Materials using Spectrum Imaging, Computer-Controlled SEM and an Annular SDD
VerfasserSalge, T., Tagle, R., Hecht, L., Ferriere, L., Ball, A.D., Kearsley, A.T., Smith, C., Jones, C.
VerlagMicroscopy and Microanalysis, 20 (Suppl. 3) , 1716-1717
Datum2014
Kennungdoi:10.1017/S1431927614010319
ArtText