Characterization of Cu2SnSe3 by spectroscopic ellipsometry

G. Gurieva, S. Levcenco, S. Schorr, M. Leon, R. Serna, A, Nateprov, E. Arushanov

TitleCharacterization of Cu2SnSe3 by spectroscopic ellipsometry
AuthorG. Gurieva, S. Levcenco, S. Schorr, M. Leon, R. Serna, A, Nateprov, E. Arushanov
PublisherThin Solid Films Vol. 535. 384-386
IdentifierDOI:10.1016/j.tsf.2012.11.104
TypeText